Overview
SnpExpert provides a quick way to explore S-parameters for SI engineers to understand the electrical characteristics of interconnects, connectors, packages, and systems. It offers comprehensive plotting functions in frequency and time domains. Crosstalk analysis is made easier with quick victim and aggressor setup and built-in PSXT, ILD, ICR, and ICN. COM analysis is also supported. Built-in compliance for various high-speed standards allows quick compliance checks. Thru-Only De-embedding (TOD) enables accurate test fixture removal with 2x thru and1x open/short/reflect. It has been verified with IEEE P370. It provides an accurate way to perform dielectric constant (Dk) and loss tangent (Df) extraction over a wide range of laminate materials. S-parameter quality such as passivity, causality, and reciprocity can be quickly checked and corrected.
Highlights
SnpExpert provides a quick way to explore S-parameters for SI engineers to understand the electrical characteristics of interconnects, connectors, packages, and systems.
SnpExpert offers comprehensive plotting functions in frequency and time domains.
Crosstalk analysis is made easier with quick victim and aggressor setup and built-in PSXT, ILD, ICR and ICN. COM analysis is also supported.
Built-in compliance for various high-speed standards allows quick compliance check.
Thru-Only De-embedding (TOD) enables accurate test fixture removal with 2x thru and1x open/short/reflect. It has been verified with IEEE P370.
SnpExpert provides an accurate way to perform dielectric constant (Dk) and loss tangent (Df) extraction over a wide range of laminate materials.
S-parameter quality such as passivity, causality and reciprocity can be quickly checked and corrected.
Main Features
S-Parameter Quality
S-parameter quality in terms of passivity, causality, reciprocity, and stability can be shown graphically.
Reciprocity, passivity and causality check both in frequency domain and time domain.
Enforce quality to generate new S-Parameters.
Thru-Only De-embedding(TOD)
Built-in through-only de-embedding to remove fixture effect for SI applications.
Support test fixture de-embedding with 2x thru,1x open/short/reflect.
Support multiple ports system de-embedding.
Frequency-Domain Plot
S-, Y-, Z-parameter, Diff S-parameter, Group delay, VSWR, customized function plot.
Time-Domain Plot
TDR and TDT with step and impulse stimuli.
Built-in delay calculator for both single-ended trace and differential pair, and skew calculator between two traces in each differential pair.
High-Speed Channel Analysis
Built-in crosstalk plots including FEXT, NEXT,PSXT, ILD, ICN, and ICR.
Built-in COM calculator and USB-Type C analysis.
Built-in customized DDR crosstalk calculation.
Dk/Df Extraction
Dk/Df extraction feature helps PCB designers to get accurate material property from measurement.
Optimization-based method has good correlation with measurement data.
One-Click Report Generation
Easy to generate report in Word/PPT/HTML.
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